The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
Journal of Technology Management & Innovation
View Archive InfoField | Value | |
Title |
The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing
The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing The Usefulness of Patent Stage and Sectoral Pattern in Open Innovation Licensing |
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Creator |
Kim, Jun Young
Park, Yongtae |
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Subject |
score model; patent; innovation; sector; pattern
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Description |
The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing.
The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing. The relative importance to the particular industry of licensing has not been done enough empirically to pursue the route of the open innovation. That is why the industrial level research on open innovation is more complicated than that of company level. This paper tries to survey industrial level licensing by combining the technology regime theory with NTB(National Technology Bank) score model of KTTC(Korea Technology Transfer Center) and tries to transform Likert score into general value proxy by using information of valuator’s organizations. This paper also introduces two new factors named as ‘patent authorization stage’ for classifying patent status and ‘technology regime based industrial innovation pattern’ for adopting sectoral level research in order to overcome drawbacks of score model in case of application to open innovation licensing. |
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Publisher |
Facultad de Economía y Negocios, Universidad Alberto Hurtado
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Contributor |
—
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Date |
2008-12-14
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Type |
info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion Artículo revisado por pares |
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Format |
application/pdf
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Identifier |
http://www.jotmi.org/index.php/GT/article/view/art96
10.4067/S0718-27242008000200004 |
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Source |
Journal of Technology Management & Innovation; Vol 3, No 4 (2008); 41-51
Journal of Technology Management & Innovation; Vol 3, No 4 (2008); 41-51 0718-2724 |
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Language |
eng
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Relation |
http://www.jotmi.org/index.php/GT/article/view/art96/461
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Rights |
Copyright (c) 2009 Journal of Technology Management & Innovation
http://creativecommons.org/licenses/by/4.0 |
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