Record Details

The Preparation and Surface Morphology Analysis of ZnO/TiO2 Composite Thin Films

Advances in Asian Social Science

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Field Value
 
Title The Preparation and Surface Morphology Analysis of ZnO/TiO2 Composite Thin Films
 
Creator Cui, Ji
 
Subject
 
Description In this paper, the ion source electron beam evaporation method was used to fabricate ZnO films with Si as the base and TiO2 as the buffer layer. By further thermal insulation and annealing treatment at different temperature conditions, different film samples were prepared for the surface morphology analysis and light scattering properties study. The experimental results show that: Annealing temperature has significant influence on the sample surface roughness, grain size, fractal dimension and other parameters, and the surface morphology analysis is helpful to understand the grain growth mechanisms of film as well as the improvement of film preparation process.
 
Publisher World Science Publisher
 
Contributor
 
Date 2016-12-07
 
Type info:eu-repo/semantics/article
info:eu-repo/semantics/publishedVersion

 
Format application/pdf
 
Identifier http://worldsciencepublisher.org/journals/index.php/AASS/article/view/1694
 
Source Advances in Asian Social Science; Vol 7, No 3 (2016); 1214-1219
2167-6429
 
Language eng
 
Relation http://worldsciencepublisher.org/journals/index.php/AASS/article/view/1694/1235
 
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